Industry Organizations
FSA
IEEE
ITRS
JEITA
JEMI
MRS
SEMATECH
SEMI
SIA
Magazines
Advanced Packaging Magazine
Chip Design Magazine
Cleanroom Technology
CleanRooms
European Semiconductor
Future Fab
III-Vs Review
MICRO
Semiconductor Intl.
Semiconductor Mfg.
Solid State Technology
Events:
Semicon Taiwan 2009
September 30 -October 2, 2009, Taipei World Trade Center, Taiwan
Semicon Europa 2009
October 6-8, 2009, Messe Dresden Germany
PV Taiwan 2009
October 7-9 2009
Semicon Japan 2009
December 2 – December 4, 2009, Makuhari Messe, Chiba, Japan
Semicon Russia 2010
June 14 -16, 2010, World Trade Center, Moscow, Russia
Semiconductor Manufacturing
All about Semiconductor Industry, Semiconductor Materials, Crystal Growth and Wafer Preparation, Contamination Control, Wafer Fabrication, Process Yields, Epitaxy, Oxidation, Lithography, Reactive Plasma Etching, Film Deposition, Ion Implantation, Metallization, Wafer Test and Evaluation, Assembly and Packaging and more
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Inspection & Measurement Equipment Manufacturers
Acoustic Spectroscopy, Electron Spectroscopy for Chemical Analysis (ESCA), Ultrasonic, Acoustical MicroscopesAir Velocity Meter (VA), Humidity and Moisture SensingAtomic Force Microscopes (AFM)ChromatographConfocal Scanning Microscope, 3-D Video MicroscopesCV (capacitance-to-voltage) Probe SystemsDefect, Particle, Bump Detection or InspectionDie Inspection, Die ShearElectron Microscope (TEM)Fiber Optic Inspection InstrumentsFilm Thickness, Thickness Measurement, EllipsometerFlat, Notch Finding SystemInstruments, Bench Top TestLeak Detection Systems - Vacuum or GasLine Width, Critica Dimension (CD) MeasurementOptical MicroscopesOverlay MeasurementPackage Inspection, Lead ScannersParticle Monitors, Analyzers - Airborne or LiquidPlate Inspection EquipmentResistivity Measurement, 4 point probe, Sheet resistanceSpectrometers, Fourier Transform Infrared(FTIR), Attenuated Total Reflectance FTIR(ATR-FTIR), Auger Electron (AES), SIMSStress, Refractive Index, Reflectivity and Conductivity MeasurementThermal Sensing, Measurement, AnalysisWafer, Substrate Metrology, Topology, Nanotopography,Flatness MeasurementWeight Measurement, Precision ScalesWire Bonding Inspection, TestX-ray, XRF, 3-D X-Ray, Lexes Systems
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Featured Companies
Hologenix - Innovative Products for the Semiconductor Industry.
WAFERMAP - Metrology Software for the Semiconductor Industry
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