Semidir.com
The Directory for Semiconductor Equipment, Materials and Service Suppliers

Main Index > Inspection & Measurement Equipment Manufacturers

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September 30 -October 2, 2009, Taipei World Trade Center, Taiwan

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October 6-8, 2009, Messe Dresden Germany

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October 7-9 2009

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December 2 – December 4, 2009, Makuhari Messe, Chiba, Japan

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Semiconductor Manufacturing
All about Semiconductor Industry, Semiconductor Materials, Crystal Growth and Wafer Preparation, Contamination Control, Wafer Fabrication, Process Yields, Epitaxy, Oxidation, Lithography, Reactive Plasma Etching, Film Deposition, Ion Implantation, Metallization, Wafer Test and Evaluation, Assembly and Packaging and more


Inspection & Measurement Equipment Manufacturers


  • Acoustic Spectroscopy, Electron Spectroscopy for Chemical Analysis (ESCA), Ultrasonic, Acoustical Microscopes
  • Air Velocity Meter (VA), Humidity and Moisture Sensing
  • Atomic Force Microscopes (AFM)
  • Chromatograph
  • Confocal Scanning Microscope, 3-D Video Microscopes
  • CV (capacitance-to-voltage) Probe Systems
  • Defect, Particle, Bump Detection or Inspection
  • Die Inspection, Die Shear
  • Electron Microscope (TEM)
  • Fiber Optic Inspection Instruments
  • Film Thickness, Thickness Measurement, Ellipsometer
  • Flat, Notch Finding System
  • Instruments, Bench Top Test
  • Leak Detection Systems - Vacuum or Gas
  • Line Width, Critica Dimension (CD) Measurement
  • Optical Microscopes
  • Overlay Measurement
  • Package Inspection, Lead Scanners
  • Particle Monitors, Analyzers - Airborne or Liquid
  • Plate Inspection Equipment
  • Resistivity Measurement, 4 point probe, Sheet resistance
  • Spectrometers, Fourier Transform Infrared(FTIR), Attenuated Total Reflectance FTIR(ATR-FTIR), Auger Electron (AES), SIMS
  • Stress, Refractive Index, Reflectivity and Conductivity Measurement
  • Thermal Sensing, Measurement, Analysis
  • Wafer, Substrate Metrology, Topology, Nanotopography,Flatness Measurement
  • Weight Measurement, Precision Scales
  • Wire Bonding Inspection, Test
  • X-ray, XRF, 3-D X-Ray, Lexes Systems









  • Featured Companies


    Hologenix - Innovative Products for the Semiconductor Industry.



    WAFERMAP - Metrology Software for the Semiconductor Industry







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