The Directory for Semiconductor Equipment, Materials and Service Suppliers

Main Index > Inspection & Measurement Equipment Manufacturers

Industry Organizations



Advanced Packaging Magazine
Chip Design Magazine
Cleanroom Technology
European Semiconductor
Future Fab
III-Vs Review
Semiconductor Intl.
Semiconductor Mfg.
Solid State Technology


Semicon Taiwan 2009
September 30 -October 2, 2009, Taipei World Trade Center, Taiwan

Semicon Europa 2009
October 6-8, 2009, Messe Dresden Germany

PV Taiwan 2009
October 7-9 2009

Semicon Japan 2009
December 2 – December 4, 2009, Makuhari Messe, Chiba, Japan

Semicon Russia 2010
June 14 -16, 2010, World Trade Center, Moscow, Russia

Semiconductor Manufacturing
All about Semiconductor Industry, Semiconductor Materials, Crystal Growth and Wafer Preparation, Contamination Control, Wafer Fabrication, Process Yields, Epitaxy, Oxidation, Lithography, Reactive Plasma Etching, Film Deposition, Ion Implantation, Metallization, Wafer Test and Evaluation, Assembly and Packaging and more

Inspection & Measurement Equipment Manufacturers

  • Acoustic Spectroscopy, Electron Spectroscopy for Chemical Analysis (ESCA), Ultrasonic, Acoustical Microscopes
  • Air Velocity Meter (VA), Humidity and Moisture Sensing
  • Atomic Force Microscopes (AFM)
  • Chromatograph
  • Confocal Scanning Microscope, 3-D Video Microscopes
  • CV (capacitance-to-voltage) Probe Systems
  • Defect, Particle, Bump Detection or Inspection
  • Die Inspection, Die Shear
  • Electron Microscope (TEM)
  • Fiber Optic Inspection Instruments
  • Film Thickness, Thickness Measurement, Ellipsometer
  • Flat, Notch Finding System
  • Instruments, Bench Top Test
  • Leak Detection Systems - Vacuum or Gas
  • Line Width, Critica Dimension (CD) Measurement
  • Optical Microscopes
  • Overlay Measurement
  • Package Inspection, Lead Scanners
  • Particle Monitors, Analyzers - Airborne or Liquid
  • Plate Inspection Equipment
  • Resistivity Measurement, 4 point probe, Sheet resistance
  • Spectrometers, Fourier Transform Infrared(FTIR), Attenuated Total Reflectance FTIR(ATR-FTIR), Auger Electron (AES), SIMS
  • Stress, Refractive Index, Reflectivity and Conductivity Measurement
  • Thermal Sensing, Measurement, Analysis
  • Wafer, Substrate Metrology, Topology, Nanotopography,Flatness Measurement
  • Weight Measurement, Precision Scales
  • Wire Bonding Inspection, Test
  • X-ray, XRF, 3-D X-Ray, Lexes Systems

  • Featured Companies

    Hologenix - Innovative Products for the Semiconductor Industry.

    WAFERMAP - Metrology Software for the Semiconductor Industry

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